Defects in N, O and N, Zn implanted ZnO bulk crystals

Comprehensive characterization of defects formed in bulk ZnO single crystals co-implanted with N and Zn as well as N and O atoms is performed by means of optically detected magnetic resonance (ODMR) complemented by Raman and photoluminescence (PL) spectroscopies. It is shown that in addition to intr...

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Bibliographic Details
Main Authors: Stehr, Jan Eric, Wang, Xingjun, Filippov, Stanislav, Pearton, S J., Gueorguiev Ivanov, Ivan, Chen, Weimin, Buyanova, Irina
Format: Others
Language:English
Published: Linköpings universitet, Funktionella elektroniska material 2013
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:liu:diva-91343