Wireless, Single Chip, High Temperature Monitoring of Power Semiconductors
Because failures in power electronics can cause production stops and unnecessary damage to interconnected equipment, monitoring schemes that are able to predict such failures provide various economic and safety benefits. The primary motivation for this thesis is that such monitoring schemes can incr...
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| Format: | Others |
| Language: | English |
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Luleå tekniska universitet, EISLAB
2016
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:ltu:diva-18113 http://nbn-resolving.de/urn:isbn:978-91-7583-565-5 http://nbn-resolving.de/urn:isbn:978-91-7583-566-2 (PDF) |