Characterization of interface states & radiation damage effects in duo-lateral PSDs : Using SEM microscopy and UV beam profiling techniques
There has been an increase in the use of duo‐lateral position sensitive detectors inpractically every radiation and beam detection application. These devices unlike other light detection system utilize the effect of the lateral division of the generated photocurrent to measure the position of the in...
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| Format: | Doctoral Thesis |
| Language: | English |
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Mittuniversitetet, Avdelningen för elektronikkonstruktion
2014
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:se:miun:diva-22221 http://nbn-resolving.de/urn:isbn:978-91-87557-71-2 |