Characterization of Solar Cell Wafers with Low Coherence Interferometry
Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out.
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| Format: | Others |
| Language: | English |
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Norges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjon
2011
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| Online Access: | http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13430 |