Characterization of Solar Cell Wafers with Low Coherence Interferometry

Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out.

Bibliographic Details
Main Author: Simonsen, Ove
Format: Others
Language:English
Published: Norges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjon 2011
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13430
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spelling ndltd-UPSALLA1-oai-DiVA.org-ntnu-134302013-01-08T13:32:46ZCharacterization of Solar Cell Wafers with Low Coherence InterferometryengSimonsen, OveNorges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjonInstitutt for elektronikk og telekommunikasjon2011ntnudaim:6303MTEL elektronikkNanoelektronikk og mikrosystemerCharacterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out. Student thesisinfo:eu-repo/semantics/bachelorThesistexthttp://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13430Local ntnudaim:6303application/pdfinfo:eu-repo/semantics/openAccess
collection NDLTD
language English
format Others
sources NDLTD
topic ntnudaim:6303
MTEL elektronikk
Nanoelektronikk og mikrosystemer
spellingShingle ntnudaim:6303
MTEL elektronikk
Nanoelektronikk og mikrosystemer
Simonsen, Ove
Characterization of Solar Cell Wafers with Low Coherence Interferometry
description Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out.
author Simonsen, Ove
author_facet Simonsen, Ove
author_sort Simonsen, Ove
title Characterization of Solar Cell Wafers with Low Coherence Interferometry
title_short Characterization of Solar Cell Wafers with Low Coherence Interferometry
title_full Characterization of Solar Cell Wafers with Low Coherence Interferometry
title_fullStr Characterization of Solar Cell Wafers with Low Coherence Interferometry
title_full_unstemmed Characterization of Solar Cell Wafers with Low Coherence Interferometry
title_sort characterization of solar cell wafers with low coherence interferometry
publisher Norges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjon
publishDate 2011
url http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13430
work_keys_str_mv AT simonsenove characterizationofsolarcellwaferswithlowcoherenceinterferometry
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