Characterization of Solar Cell Wafers with Low Coherence Interferometry
Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out.
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Norges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjon
2011
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ndltd-UPSALLA1-oai-DiVA.org-ntnu-134302013-01-08T13:32:46ZCharacterization of Solar Cell Wafers with Low Coherence InterferometryengSimonsen, OveNorges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjonInstitutt for elektronikk og telekommunikasjon2011ntnudaim:6303MTEL elektronikkNanoelektronikk og mikrosystemerCharacterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out. Student thesisinfo:eu-repo/semantics/bachelorThesistexthttp://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13430Local ntnudaim:6303application/pdfinfo:eu-repo/semantics/openAccess |
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English |
format |
Others
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ntnudaim:6303 MTEL elektronikk Nanoelektronikk og mikrosystemer |
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ntnudaim:6303 MTEL elektronikk Nanoelektronikk og mikrosystemer Simonsen, Ove Characterization of Solar Cell Wafers with Low Coherence Interferometry |
description |
Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out. |
author |
Simonsen, Ove |
author_facet |
Simonsen, Ove |
author_sort |
Simonsen, Ove |
title |
Characterization of Solar Cell Wafers with Low Coherence Interferometry |
title_short |
Characterization of Solar Cell Wafers with Low Coherence Interferometry |
title_full |
Characterization of Solar Cell Wafers with Low Coherence Interferometry |
title_fullStr |
Characterization of Solar Cell Wafers with Low Coherence Interferometry |
title_full_unstemmed |
Characterization of Solar Cell Wafers with Low Coherence Interferometry |
title_sort |
characterization of solar cell wafers with low coherence interferometry |
publisher |
Norges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjon |
publishDate |
2011 |
url |
http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13430 |
work_keys_str_mv |
AT simonsenove characterizationofsolarcellwaferswithlowcoherenceinterferometry |
_version_ |
1716523513728204800 |