Characterization of Solar Cell Wafers with Low Coherence Interferometry

Characterize silicon wafers used in solar cell production with a NIR-LCI interferometer. The interferometer is further developed and measurements on silicon samples are carried out.

Bibliographic Details
Main Author: Simonsen, Ove
Format: Others
Language:English
Published: Norges teknisk-naturvitenskapelige universitet, Institutt for elektronikk og telekommunikasjon 2011
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-13430

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