Exploring possibilities in AFM studies of InAs/GaAs QDs

The main focus of this master thesis work has been to image InAs emph{quantum dots} (QDs) using emph{atomic force microscopy} (AFM), to identify and evaluate various image processing methods used to estimate the volume of the InAs QDs. The InAs QDs studied in this thesis work, had been deposited on...

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Bibliographic Details
Main Author: Iden, Simon Riis
Format: Others
Language:English
Published: Norges teknisk-naturvitenskapelige universitet, Institutt for fysikk 2012
Subjects:
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:no:ntnu:diva-16356