Characterizing optical and electrical properties of monolayer MoS2 by backside absorbing layer microscopy

Characterizing optical and electrical properties of monolayer MoS2 by backside absorbing layer microscopy

Nanomaterials are playing an increasing role in novel technologies, and it is important to develop optical methods to characterize them in situ.  To that end, backside absorbing layer microscopy (BALM) has emerged as a powerful tool, being capable to resolve sub-nanometer height profiles, with video...

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Bibliographic Details
Main Author: Ullberg, Nathan
Format: Others
Language:English
Published: Uppsala universitet, Institutionen för fysik och astronomi 2020
Subjects:
backside absorbing layer microscopy
BALM
monolayer MoS2
TMD
TMDC
2D materials
nanomaterials
nanotechnology
refractive index
extinction coefficient
absorption coefficient
field-effect transistor
FET
semiconductors
optoelectronics
optics
raw image processing
chemical vapor deposition
CVD
in situ characterization
Nano Technology
Nanoteknik
Condensed Matter Physics
Den kondenserade materiens fysik
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-419630

Internet

http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-419630

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