Interaction of Ultrashort X-ray Pulses with Material

Interaction of Ultrashort X-ray Pulses with Material

Radiation damage limits the resolution in imaging experiments. Damage is caused by energy deposited into the sample during exposure. Ultrashort and extremely bright X-ray pulses from free-electron lasers (FELs) offer the possibility to outrun key damage processes, and temporarily improve radiation t...

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Bibliographic Details
Main Author: Bergh, Magnus
Format: Doctoral Thesis
Language:English
Published: Uppsala universitet, Institutionen för cell- och molekylärbiologi 2007
Subjects:
free-electron laser
dense plasma
X-ray
radiation damage
laser physics
nano-plasma
Molecular Dynamics
Molecular biophysics
Molekylär biofysik
Online Access:http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-8274
http://nbn-resolving.de/urn:isbn:978-91-554-6996-2

Internet

http://urn.kb.se/resolve?urn=urn:nbn:se:uu:diva-8274
http://nbn-resolving.de/urn:isbn:978-91-554-6996-2

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