Thin Film Metal-Insulator-Metal Tunnel Junctions For Millimeter Wave Detection
Millimeter wave imaging systems are the next generation imaging systems being developed for security and surveillance purposes. In this work, thin film metal-insulator-metal (MIM) tunnel junction based detector using Ni-NiO-Cr has been developed for the first time for millimeter wave detection opera...
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| Format: | Others |
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Scholar Commons
2008
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| Online Access: | https://scholarcommons.usf.edu/etd/346 https://scholarcommons.usf.edu/cgi/viewcontent.cgi?article=1345&context=etd |