X-ray diffraction applications in thin films and (100) silicon substrate stress analysis

Silicon is used as a substrate for X-ray mirrors for correct imaging. The substrate needs to be mechanically bent to produce a certain curvature in order to condition and focus the X-ray beam. The X-rays impinge a mirror at very shallow angles, in order to reduce the amount of intensity loss in the...

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Bibliographic Details
Main Author: Rachwal, James D
Format: Others
Published: Scholar Commons 2010
Subjects:
Online Access:http://scholarcommons.usf.edu/etd/1745
http://scholarcommons.usf.edu/cgi/viewcontent.cgi?article=2744&context=etd