X-ray diffraction applications in thin films and (100) silicon substrate stress analysis
Silicon is used as a substrate for X-ray mirrors for correct imaging. The substrate needs to be mechanically bent to produce a certain curvature in order to condition and focus the X-ray beam. The X-rays impinge a mirror at very shallow angles, in order to reduce the amount of intensity loss in the...
Main Author: | |
---|---|
Format: | Others |
Published: |
Scholar Commons
2010
|
Subjects: | |
Online Access: | http://scholarcommons.usf.edu/etd/1745 http://scholarcommons.usf.edu/cgi/viewcontent.cgi?article=2744&context=etd |