Reliability-centric probabilistic analysis of VLSI circuits
Reliability is one of the most serious issues confronted by microelectronics industry as feature sizes scale down from deep submicron to sub-100-nanometer and nanometer regime. Due to processing defects and increased noise effects, it is almost impractical to come up with error-free circuits. As we...
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| Format: | Others |
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Scholar Commons
2006
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| Online Access: | http://scholarcommons.usf.edu/etd/2670 http://scholarcommons.usf.edu/cgi/viewcontent.cgi?article=3669&context=etd |