A Framework for Determining the Reliability of Nanoscale Metallic Oxide Semiconductor (MOS) Devices
An increase in worldwide investments during the past several decades has pro-pelled scienti c breakthroughs in nanoscience and technology research to new and exciting levels. To ensure that these discoveries lead to commercially viable prod-ucts, it is important to address some of the fundamental en...
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| Format: | Others |
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Scholar Commons
2010
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| Online Access: | http://scholarcommons.usf.edu/etd/3499 http://scholarcommons.usf.edu/cgi/viewcontent.cgi?article=4694&context=etd |