Low-Power and Robust Level-Shifter with Contention Mitigation for Memory and Standalone Applications

The scaling down of transistor sizes has imposed significant challenges in today's technology. Memories such as eDRAM, are experiencing poor retention time because of challenges such as reference voltage variation, high transistor leakage, and low cell capacitance. It can be seen that we must c...

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Bibliographic Details
Main Author: Ramclam, Kenneth M.
Format: Others
Published: Scholar Commons 2015
Subjects:
Online Access:https://scholarcommons.usf.edu/etd/5555
https://scholarcommons.usf.edu/cgi/viewcontent.cgi?article=6755&context=etd