Design of Negative Bias Temperature Instability (NBTI) Tolerant Register File
Degradation of transistor parameter values due to Negative Bias Temperature Instability (NBTI) has emerged as a major reliability problem in current and future technology generations. NBTI Aging of a Static Random Access Memory (SRAM) cell leads to a lower noise margin, thereby increasing the failur...
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DigitalCommons@USU
2012
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| Online Access: | https://digitalcommons.usu.edu/etd/1160 https://digitalcommons.usu.edu/cgi/viewcontent.cgi?article=2163&context=etd |