A Study of Helium Ion Induced Secondary Electron Production
The scanning electron microscope (SEM) is a popular instrument used for imaging because of its high resolution images it can generate. However the new scanning helium ion scanning microscope (SHIM) can produce higher resolution and better contrast images than the conventional SEM. In both the micros...
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| Format: | Others |
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Trace: Tennessee Research and Creative Exchange
2009
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| Online Access: | http://trace.tennessee.edu/utk_graddiss/103 |