Low temperature scanning tunneling microscope study of metallic thin films and nanostructures on the semiconductor substrates

Many properties of the thin films are different from the bulk value and in many cases, depend dramatically on the film thickness. In the metallic ultra-thin films epitaxially grown on the semiconductor substrate, the conduction electrons are confined by the vacuum and metal-semiconductor interface....

Full description

Bibliographic Details
Main Author: Qin, Shengyong, 1980-
Format: Others
Language:English
Published: 2012
Subjects:
Online Access:http://hdl.handle.net/2152/18267