Nonlinear optical characterization of Si/high-k dielectric interfaces

Nonlinear optical characterization of Si/high-k dielectric interfaces

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Bibliographic Details
Main Author: Carriles Jaimes, Ramón
Format: Others
Language:English
Published: 2008
Subjects:
Silicon > Optical properties
Second harmonic generation
Dielectrics
Online Access:http://hdl.handle.net/2152/2399

Internet

http://hdl.handle.net/2152/2399

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