Low power scan testing and test data compression

Low power scan testing and test data compression

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Bibliographic Details
Main Author: Lee, Jinkyu
Format: Others
Language:English
Published: 2008
Subjects:
Systems on a chip > Testing
Data compression (Computer science) > Testing
Online Access:http://hdl.handle.net/2152/2568

Internet

http://hdl.handle.net/2152/2568

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