Predicting performance parameters of analog and mixed-signal circuits using built-in and built-off self test
The widespread use of embedded mixed-signal cores in system-on-chip (SoC) or System-on-Package (SoP) design has been increasingly important in cost-effective manufacturing test for mixed-signal devices. A typical SoP encapsulates many of its internal functions, and its production test is performed b...
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| Format: | Others |
| Language: | English |
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2008
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| Online Access: | http://hdl.handle.net/2152/3618 |