Incorporating the effect of delay variability in path based delay testing

Incorporating the effect of delay variability in path based delay testing

Delay variability poses a formidable challenge in both design and test of nanometer circuits. While process parameter variability is increasing with technology scaling, as circuits are becoming more complex, the dynamic or vector dependent variability is also increasing steadily. In this research, w...

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Bibliographic Details
Main Author: Tayade, Rajeshwary G.
Format: Others
Language:English
Published: 2009
Subjects:
Delay testing
Delay variability
Path based delay testing
Path selection
Path selection algorithms
Delay fault models
Multiple-input switching
Coupling noise
Nanometer circuits
Online Access:http://hdl.handle.net/2152/6559

Internet

http://hdl.handle.net/2152/6559

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