Enhancing silicon debug techniques via DFD hardware insertion
As technology is advancing, larger and denser devices are being manufactured with shorter time to market requirements. Identifying and resolving problems in integrated circuits (ICs) are the main focus of the pre-silicon and post-silicon debug process. As indicated in the International Technology Ro...
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| Format: | Others |
| Language: | English |
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2009
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| Online Access: | http://hdl.handle.net/2152/6622 |