Detection of burst noise using the chi-squared goodness of fit test
Statistically more test samples obtained from a single chip would give a better picture of the various noise processes present. Increasing the number of samples while testing one chip would however lead to an increase in the testing time, decreasing the overall throughput. The aim of this report is...
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| Format: | Others |
| Language: | English |
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2010
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| Online Access: | http://hdl.handle.net/2152/ETD-UT-2009-08-180 |