Read/write assist circuits and SRAM design

This report discusses the design of read/write assist circuits which are used in a SRAM cell’s design to overcome the cell’s variations. It also explains the variability problems in a SRAM bit-cell and many approaches to address them. The basic operations, SNM concept, and write margin of an SRAM...

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Bibliographic Details
Main Author: Nguyen, Quocdat Tai
Format: Others
Language:English
Published: 2010
Subjects:
Online Access:http://hdl.handle.net/2152/ETD-UT-2009-12-692