Read/write assist circuits and SRAM design
This report discusses the design of read/write assist circuits which are used in a SRAM cell’s design to overcome the cell’s variations. It also explains the variability problems in a SRAM bit-cell and many approaches to address them. The basic operations, SNM concept, and write margin of an SRAM...
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Format: | Others |
Language: | English |
Published: |
2010
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Online Access: | http://hdl.handle.net/2152/ETD-UT-2009-12-692 |