A RADIATION-HARDENED-BY-DESIGN CHARGE PUMP FOR PHASE-LOCKED LOOP CIRCUITS

Single-event transients (SETs) due to terrestrial or space radiation exposure have become a growing concern in modern high-speed analog and mixed-signal electronics. Recent work with computer circuit-level simulation techniques has enabled the understanding of SET effects in mixed-signal and radio-f...

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Bibliographic Details
Main Author: Loveless, Thomas Daniel
Other Authors: Dr. Lloyd Massengill
Format: Others
Language:en
Published: VANDERBILT 2008
Subjects:
Online Access:http://etd.library.vanderbilt.edu/available/etd-01292008-150433/