Material, Optical and Electro-optical Characterization of Si and Si-based Devices Under the Influence of High Energy Radiation
Radiation effects studies performed on electronics typically consist of electrical characterization of device performance to analyze the impact of radiation damage. Very few studies have focused on surface characterization of materials under high energy radiation, particularly those materials widely...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2015
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-03232015-123555/ |