Cross-Layered Reliability Analysis of Object-Tracking Algorithms to Radiation-Induced Soft Errors

Hardware implementations of Object-Tracking Algorithms are susceptible to radiation-induced soft errors. The thesis analyzes the results of fault emulation experiments conducted on register-transfer level on a field programmable gate array (FPGA) implementation of object tracking. Typical single eve...

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Bibliographic Details
Main Author: QIU, HAO
Other Authors: William H. Robinson
Format: Others
Language:en
Published: VANDERBILT 2017
Subjects:
Online Access:http://etd.library.vanderbilt.edu/available/etd-03262017-152441/