ON-CHIP CHARACTERIZATION OF SINGLE-EVENT CHARGE-COLLECTION
Particle strikes on microelectronic circuits lead to undesirable current transients on the circuit node due to charge generation and charge collection processes. Typically, TCAD tools are used to examine charge collection process after particle strikes and provide an insight into the various charge...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2012
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-08052012-215357/ |