A GENERALIZED SINGLE-EVENT ANALYSIS AND HARDENING OPTIONS FOR MIXED-SIGNAL PHASE-LOCKED LOOP CIRCUITS
A reliability concern of growing interest in the microelectronics community is the deleterious effect of ionizing radiation. The so-called "single events" single particles which can penetrate semiconductor material leaving ionized charge in their wake can cause information corruption and t...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2009
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| Online Access: | http://etd.library.vanderbilt.edu//available/etd-08262009-132854/ |