DIRECT IONIZATION-INDUCED TRANSIENT FAULT ANALYSIS FOR COMBINATIONAL LOGIC AND SEQUENTIAL CAPTURE IN DIGITAL INTEGRATED CIRCUITS FOR LIGHTLY-IONIZING ENVIRONMENTS.
Digital integrated circuits (ICs) fabricated in advanced semiconductor processes are susceptible to single event effects from lightly ionizing particles (e.g., alpha particles, protons, and muons). Furthermore, these ICs exhibit complex responses due to interactions with these particles. Characteriz...
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| Format: | Others |
| Language: | en |
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VANDERBILT
2011
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-11302011-123349/ |