Impact of Logic Synthesis on the Soft Error Rate of Digital Integrated Circuits
Radiation-induced soft errors are becoming a dominant reliability-failure mechanism in modern CMOS technologies. In nanometer technologies, the effects are not limited to the storage elements of a digital system, but also include vulnerabilities in the combinational logic. Reliability-aware synthesi...
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| Language: | en |
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VANDERBILT
2012
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| Online Access: | http://etd.library.vanderbilt.edu/available/etd-11302012-110113/ |