Optical and thermal characteristics of thin polymer and polhedral oligomeric silsesquioxane (POSS) filled polymer films
Single wavelength ellipsometry measurements at Brewster's angle provide a powerful technique for characterizing ultrathin polymeric films. By conducting the experiments in different ambient media, multiple incident media (MIM) ellipsometry, simultaneous determinations of a film's thicknes...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Published: |
Virginia Tech
2014
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10919/27713 http://scholar.lib.vt.edu/theses/available/etd-05142008-181528/ |