Techniques for Seed Computation and Testability Enhancement for Logic Built-In Self Test
With the increase of device complexity and test-data volume required to guarantee adequate defect coverage, external testing is becoming increasingly difficult and expensive. Logic Built-in Self Test (LBIST) is a viable alternative test strategy as it helps reduce dependence on an elaborate external...
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Virginia Tech
2014
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| Online Access: | http://hdl.handle.net/10919/35474 http://scholar.lib.vt.edu/theses/available/etd-10232012-054143/ |