Integrated Enhancement of Testability and Diagnosability for Digital Circuits

Integrated Enhancement of Testability and Diagnosability for Digital Circuits

While conventional test point insertions commonly used in design for testability can improve fault coverage, the test points selected may not necessarily be the best candidates to aid <em>silicon diagnosis</em>. In this thesis, test point insertions are conducted with the aim to detect m...

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Bibliographic Details
Main Author: Rahagude, Nikhil Prakash
Other Authors: Electrical and Computer Engineering
Format: Others
Published: Virginia Tech 2014
Subjects:
Fault Coverage
Diagnostic Resolution
Weighted Average
Test Point Insertion
Design for Testability
Design for Diagnosability
Built-in Self Test
Online Access:http://hdl.handle.net/10919/35609
http://scholar.lib.vt.edu/theses/available/etd-11052010-133921/

Internet

http://hdl.handle.net/10919/35609
http://scholar.lib.vt.edu/theses/available/etd-11052010-133921/

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