Probability of latching single event upset errors in VLSI circuits
The ability of radiation to cause transient faults in space borne as well as ground based computers is well known. with the density of VLSI circuits increasing every year, the probability of an upset by radiation is becoming more likely. However, research in this area has matured over the last decad...
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| Format: | Others |
| Language: | en |
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Virginia Tech
2014
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| Online Access: | http://hdl.handle.net/10919/41980 http://scholar.lib.vt.edu/theses/available/etd-04082009-040435/ |