Susceptibility evaluation of combational logic in VLSI circuits
A number of errors occur in digital systems operating in a harsh radiation environment. These errors are due to transient faults which may cause a temporary change in the state of the system without any permanent damage. These transient faults are referred to as Single Event Upsets (SEUs). Because o...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en |
| Published: |
Virginia Tech
2014
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10919/42221 http://scholar.lib.vt.edu/theses/available/etd-04252009-040716/ |