Laser Scanning Imaging for Increased Depth-Of-Focus

Throughout the decades, different techniques have been proposed to improve the depth-of-focus in optical microscopy. Common techniques like optical sectioning microscopy and scanning confocal microscopy have innate problems. By simply modifying the pupil function in microscope imaging system, we can...

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Bibliographic Details
Main Author: Shin, Dong-Ik
Other Authors: Electrical and Computer Engineering
Format: Others
Published: Virginia Tech 2014
Subjects:
Online Access:http://hdl.handle.net/10919/44190
http://scholar.lib.vt.edu/theses/available/etd-08072002-194429/