Laser Scanning Imaging for Increased Depth-Of-Focus
Throughout the decades, different techniques have been proposed to improve the depth-of-focus in optical microscopy. Common techniques like optical sectioning microscopy and scanning confocal microscopy have innate problems. By simply modifying the pupil function in microscope imaging system, we can...
Main Author: | Shin, Dong-Ik |
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Other Authors: | Electrical and Computer Engineering |
Format: | Others |
Published: |
Virginia Tech
2014
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Subjects: | |
Online Access: | http://hdl.handle.net/10919/44190 http://scholar.lib.vt.edu/theses/available/etd-08072002-194429/ |
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