Integration of an X-Y prober with CAD driven database and test generation software for the testing of printed circuit boards
<p>Guided probe testing of printed circuit boards is a technique that has been well developed by automatic test equipment manufacturers to pinpoint faults. Though the guided probe technique of testing printed circuit boards is a process capable of providing high diagnostic resolution, the t...
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| Format: | Others |
| Language: | en |
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Virginia Tech
2014
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| Online Access: | http://hdl.handle.net/10919/45664 http://scholar.lib.vt.edu/theses/available/etd-11142012-040156/ |