Effects of Electric Fields on Forces between Dielectric Particles in Air

We developed a quantitative measurement technique using atomic force microscopy (AFM) to study the effects of both DC and AC external electric fields on the forces between two dielectric microspheres. In this work we measured the DC and AC electric field-induced forces and adhesion force between two...

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Bibliographic Details
Main Author: Chiu, Ching-Wen
Other Authors: Chemical Engineering
Format: Others
Language:en_US
Published: Virginia Tech 2017
Subjects:
AFM
Online Access:http://hdl.handle.net/10919/76755
http://scholar.lib.vt.edu/theses/available/etd-05132013-192836/