Increasing Branch Coverage with Dual Metric RTL Test Generation
In this thesis, we present a new register-transfer level (RTL) test generation method that makes use of two coverage metrics, Branch Coverage, and Mutation Coverage across two stages, to cover hard-to-reach points previously unreached. We start with a preprocessing stage by converting the RTL sou...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Others |
| Published: |
Virginia Tech
2020
|
| Subjects: | |
| Online Access: | http://hdl.handle.net/10919/96581 |