Design of Soft Error Robust High Speed 64-bit Logarithmic Adder
Continuous scaling of the transistor size and reduction of the operating voltage have led to a significant performance improvement of integrated circuits. However, the vulnerability of the scaled circuits to transient data upsets or soft errors, which are caused by alpha particles and cosmic neutron...
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| Language: | en |
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2009
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| Online Access: | http://hdl.handle.net/10012/4202 |