CAD Techniques for Robust FPGA Design Under Variability
The imperfections in the semiconductor fabrication process and uncertainty in operating environment of VLSI circuits have emerged as critical challenges for the semiconductor industry. These are generally termed as process and environment variations, which lead to uncertainty in performance and unr...
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| Language: | en |
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2010
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| Online Access: | http://hdl.handle.net/10012/5468 |