A Comprehensive Test and Diagnostic Strategy for TCAMs
Content addressable memories (CAMs) are gaining popularity with computer networks. Testing costs of CAMs are extremely high owing to their unique configuration. In this thesis, a fault analysis is carried out on an industrial ternary CAM (TCAM) design, and search path test algorithms are designe...
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| Format: | Others |
| Language: | en |
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University of Waterloo
2006
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| Online Access: | http://hdl.handle.net/10012/809 |