A sequential Bayesian cumulative conformance control chart for high yield processes
For mass production, the traditional approach of drawing the confidence limits was satisfactory when many bad units were being produced; however, the same approach becomes ineffective for high yield processes, when the defective rates have small magnitudes, such as parts per million. In particular,...
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| Format: | Others |
| Language: | en_US |
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Wichita State University
2010
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| Online Access: | http://hdl.handle.net/10057/2377 |