Interferometric measurements of nonlinear optical properties for all optical switching applications in dielectric waveguides.
The successful implementation of nonlinear devices, for example for all-optical switching, depends critically on the availability of appropriate nonlinear optical materials. Most of the currently used methods to measure optical nonlinearities of materials are either indirect or inadequate for separa...
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| Language: | en |
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The University of Arizona.
1994
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| Online Access: | http://hdl.handle.net/10150/186968 |