Control of Plasma Etching of Semiconductor Surfaces

The current semiconductor device manufacturing requires more strict control of plasma etching. In this research, plasma etching was investigated through gas phase characterization and interface reactions. Hydrogen and nitrogen were added to Ar plasmas to manipulate the electro-physical properties th...

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Bibliographic Details
Main Author: Zhu, Hongbin
Other Authors: Muscat, Anthony J
Language:EN
Published: The University of Arizona. 2005
Subjects:
InP
Online Access:http://hdl.handle.net/10150/195314