ALTERNATE SCREENING PROCEDURES FOR SEMICONDUCTOR VISUAL INSPECTION

A sequence of electrical tests was developed to provide a viable alternative to the performance of high magnification visual inspection for high reliability integrated circuits in a large volume production environment. The primary approach was based on: close monitoring of the Substrate-N epi I-V ch...

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Bibliographic Details
Main Author: Guarin, Fernando, 1954-
Language:en_US
Published: The University of Arizona. 1987
Subjects:
Online Access:http://hdl.handle.net/10150/276463
http://arizona.openrepository.com/arizona/handle/10150/276463