ALTERNATE SCREENING PROCEDURES FOR SEMICONDUCTOR VISUAL INSPECTION
A sequence of electrical tests was developed to provide a viable alternative to the performance of high magnification visual inspection for high reliability integrated circuits in a large volume production environment. The primary approach was based on: close monitoring of the Substrate-N epi I-V ch...
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| Language: | en_US |
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The University of Arizona.
1987
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| Online Access: | http://hdl.handle.net/10150/276463 http://arizona.openrepository.com/arizona/handle/10150/276463 |