Scanning tunneling microscopy of layered structure semiconductors
Semiconductors are characterized by atomic resolution imaging and density of states measurements (DOS) obtained through the use of a scanning tunneling microscope (STM). The DOS of the conduction and valence bands can be measured separately with a STM as opposed to an optical measurement which measu...
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| Language: | en_US |
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The University of Arizona.
1988
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| Online Access: | http://hdl.handle.net/10150/276807 |