Advanced Data Analysis and Test Planning for Highly Reliable Products
Accelerated life testing (ALT) has been widely used in collecting failure time data of highly reliable products. Most parametric ALT models assume that the ALT data follows a specific probability distribution. However, the assumed distribution may not be adequate in describing the underlying failure...
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| Language: | en_US |
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The University of Arizona.
2014
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| Online Access: | http://hdl.handle.net/10150/344222 |